T-GARC Node: Datasets for Technology Database for Carbon Neutrality
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Data set: Etching of wafer, etching gases mix, semiconductor industry average (00.00.001)

Full name
Etching of wafer, etching gases mix, semiconductor industry average; etching; production mix
Location
KR
Reference year
2023
Valid until
2027
Reference flow(s)
Type
LCI result
Parameterized?
no
LCIA results included?
no
Category
Materials production / Other materials
Synonyms
Use advice for data set
Data set use approval
General comment
In the semiconductor manufacturing process, the etching process is a core unit process following the photolithography process that selectively removes unnecessary oxide layers on the wafer to form circuit patterns. Etching is broadly divided into wet etching and dry etching. Wet etching uses a liquid chemical solution to induce a chemical reaction that dissolves and removes specific areas. On the other hand, dry etching utilizes reactive gases or ions in a plasma state to physically and chemically etch the surface, offering superior characteristics for realizing fine patterns.
LCI Method Principle
Attributional
LCI Method Approaches
  • Other
  • Allocation - equal distribution
Completeness of product model
All relevant flows quantified
Reviews
  • Accredited third party review by
    No records found.
License and access conditions
Copyright
yes
License type
Free of charge for all users and uses
Owner of data set
KIER
Technical purpose
Input Products
No records found.
Co-Products
No records found.
Data set version
00.00.001
Time stamp (last saved)
2026-08-14T15:47:47.000
Data set format
Compliance systems
No records found.
Tag
Registered in
Registry nameBase URLStatus
GLADhttps://www.globallcadataaccess.org
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